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4 - Imaging using electrons and ion beams
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- Book:
- Focused Ion Beam Systems
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- 12 January 2010
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- 13 September 2007, pp 87-125
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Comparative Study of Scanning Ion Microscope and Scanning Electron Microscope Images Using Monte Carlo Simulations
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 140-141
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- August 2004
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Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 3 / May 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 287-291
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- May 2001
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Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System
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- Microscopy and Microanalysis / Volume 5 / Issue 5 / September 1999
- Published online by Cambridge University Press:
- 08 August 2002, pp. 365-370
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- September 1999
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Effects of Dwell Time and Current Density on Ion-Induced Deposition of Tungsten
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- Journal:
- MRS Online Proceedings Library Archive / Volume 181 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 585
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- 1990
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